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Ergebnis 11 von 208
Eleventh IEEE European Test Symposium (ETS'06), 2006, p.219-224
2006
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Autor(en) / Beteiligte
Titel
A DFT Architecture for Asynchronous Networks-on-Chip
Ist Teil von
  • Eleventh IEEE European Test Symposium (ETS'06), 2006, p.219-224
Ort / Verlag
IEEE
Erscheinungsjahr
2006
Quelle
IEEE Xplore
Beschreibungen/Notizen
  • The networks-on-chip (NoCs) paradigm is emerging as a solution for the communication of SoCs. Many NoC architecture propositions are presented but few works on testing these network architectures. To test the SoCs, the main challenge is to reach into the embedded cores (i.e, the IPs). In this case, the DFT techniques that integrate test architectures into the SoCs to ease the test of these SoCs are really favoured. In this paper, we present a new methodology for testing NoC architectures. A modular, generic, scalable and configurable DFT architecture is developed in order to ease the test of NoC architectures. The target of this test architecture is asynchronous NoC architectures that are implemented in GALS systems. The proposed architecture is therefore named ANoC-TEST and is implemented in QDI asynchronous circuits. In addition, this architecture can be used to test the computing resources of the networked SoCs. Some initial results and conclusions are also given
Sprache
Englisch
Identifikatoren
ISBN: 0769525660, 9780769525662
ISSN: 1530-1877
eISSN: 1558-1780
DOI: 10.1109/ETS.2006.3
Titel-ID: cdi_ieee_primary_1628178

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