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Reduced unknowns meshing for the partial element equivalent circuit approach
Ist Teil von
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005, 2005, Vol.3, p.805-810 Vol. 3
Ort / Verlag
IEEE
Erscheinungsjahr
2005
Quelle
IEEE Xplore
Beschreibungen/Notizen
In this paper, we present an overview of techniques for meshing EMC and signal or power integrity problems for the PEEC method. For these problems, the geometries usually consist of complex heterogeneous mixed circuit and electromagnetic structures. Hence, these structures include different complex mixed electrical and electromagnetic details unlike, for example, a more homogeneous scattering problem. One of the issues of interest are minimizing the complexity of the meshing while preserving sufficient accuracy. We consider some of the fundamental mixed-problem meshing issues and some of the algorithmic issues which are important for this class of problems when the partial element equivalent circuit approach is applied.