Details

Autor(en) / Beteiligte

• Karis, T.E.
• Guo, X.C.
• Marinero, E.
• Yen, B.K.
• Marchon, B.

Titel

Poisoning of orientation ratio on NiP-coated substrates

Ist Teil von

• INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005, 2005, p.1739-1740

Ort / Verlag

IEEE

Erscheinungsjahr

2005

Link zum Volltext

• IEEE_Xplore

Quelle

IEEE Xplore

Beschreibungen/Notizen

• The surface chemical evolution of NiP-coated AlMag disk substrate was analyzed using contact angle, X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy techniques. Its effect on magnetic film structure and orientation ratio was also studied. It was also shown that slow nickel carbonate surface growth under ambient condition poisoned the orientation ratio of the structure.