Details

Autor(en) / Beteiligte

• Rothwell, J.H.
• Flavin, D.A.

Titel

Dispersion measurement by white-light interferometry based on Fresnel reflections

Ist Teil von

• 2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003) (IEEE Cat. No.03TH8666), 2003, p.496

Ort / Verlag

IEEE

Erscheinungsjahr

2003

Quelle

IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• In this paper, we have demonstrated a white-light interferometric technique for characterisation of the dispersion, based on interferograms arising from Fresnel reflections at the sample surfaces. This technique has been shown to yield high-resolution measurements and has the potential for wide application in the characterisation of photonic materials.