IEEE photonics technology letters, 1992-01, Vol.4 (1), p.105-107
1992
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Details
- Autor(en) / Beteiligte
- Titel
- Simultaneous thickness and group index measurement using optical low-coherence reflectometry
- Ist Teil von
- IEEE photonics technology letters, 1992-01, Vol.4 (1), p.105-107
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 1992
- Quelle
- IEEE Xplore
- Beschreibungen/Notizen
- Using high-resolution optical reflectometry, group index and physical thickness can both be determined by precisely measuring optical time delays through a sample. Optical low-coherence reflectometry offers both the high-spatial resolution and large dynamic range required to perform accurate measurements using this technique.< >
- Sprache
- Englisch
- Identifikatoren
- ISSN: 1041-1135eISSN: 1941-0174DOI: 10.1109/68.124892Titel-ID: cdi_ieee_primary_124892
- Format
- –
- Schlagworte
- Electron optics, Gallium arsenide, HEMTs, Mirrors, Optical control, Optical devices, Optical interferometry, Optical mixing, Reflectometry, Thickness measurement