IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479), 2003, p.95-96
2003
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- Prediction of field-emission array drive characteristics from single-tip I-V data
- Ist Teil von
- IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479), 2003, p.95-96
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 2003
- Quelle
- IEEE Electronic Library Online
- Beschreibungen/Notizen
- In this paper, we reports on the analysis of emission data collected from a set of single emitter cathodes and uses the results of the analysis to predict the expectation value of the I-V characteristics of a multi-emitter array with an integral resistive layer.
- Sprache
- Englisch
- Identifikatoren
- ISBN: 4818195154, 9784818195158DOI: 10.1109/IVMC.2003.1223000Titel-ID: cdi_ieee_primary_1223000
- Format
- –
- Schlagworte
- Cathodes, Circuits, Data analysis, Electrical resistance measurement, Equations, Field emitter arrays, Information geometry, Resistors, Testing, Voltage