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FEM analysis of MMIC microstrip structures up to 40GHz for studying effects of dispersion and physical dimensions on effective dielectric constant and characteristic impedance behaviour
Ist Teil von
2002 3rd International Conference on Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002, 2002, p.856-859
Ort / Verlag
IEEE
Erscheinungsjahr
2002
Quelle
IEEE Electronic Library (IEL)
Beschreibungen/Notizen
This paper presents a behavioural study of the microstrip's electrical parameters viz. effective dielectric constant (/spl epsiv//sub eff/) and characteristic impedance (Z/sub o/) in a multi-layered dielectric medium (MMIC) on a GaAs substrate with a conducting strip of finite thickness. The effects of variation of microstrip width, substrate height and frequency on /spl epsiv//sub eff/ and Z/sub o/ have been evaluated up to 40 GHz with the help of a High Frequency Structure Simulator (HFSS) which employs Finite Element Method for solving electromagnetic fields associated with 3D MMIC structures.