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Details

Autor(en) / Beteiligte
Titel
Errors in Secondary Readings of CTP-Profilers, Caused by Random Deviation and Transient Response
Ist Teil von
  • OCEANS '76, 1976, p.514-517
Erscheinungsjahr
1976
Quelle
IEEE Xplore
Beschreibungen/Notizen
  • Conductivity, temperature and pressure profiling instruments usually being fitted with the best of available sensors, differences of readings with laboratory tests or intercalibration in sufficiently homogeneous water are merely a question of calibration, not of quality. Even in areas of very homogeneous deep water one finds random deviations of water properties much larger than the tolerance of measuring and calculation, and larger with the primary readings C , T and P than with the secondary ones \delta and S. These deviations give rise to additional large errors in the secondary readings, caused by the different transient responses of the sensors, and by the way to get the primary readings from the output of the sensors. By computer simulation it was found, that 0.01\deg C random deviation and a certain thermometer cause 0.8\cdotp10^{-5} ruggedness of \delta with a sampling system. With an averaging system the value is 0.5\cdotp10^{-5} and can easily be reduced to 0.25\cdotp10^{-5} .
Sprache
Englisch
Identifikatoren
DOI: 10.1109/OCEANS.1976.1154281
Titel-ID: cdi_ieee_primary_1154281

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