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A Novel Digital Two-Tone Load-Pull Architecture for Assessing RF Device Nonlinear Behavior
Ist Teil von
2024 International Conference on Microwave and Millimeter Wave Technology (ICMMT), 2024, Vol.1, p.1-3
Ort / Verlag
IEEE
Erscheinungsjahr
2024
Quelle
IEEE/IET Electronic Library (IEL)
Beschreibungen/Notizen
A method to characterize the nonlinear effects of an RF device under a two-tone stimulus using the digital load-pull technique is presented. Instead of using a mechanical load-pull tuner, a digital microprocessor-based active load-pull architecture is implemented, which provides precise and rapid control over impedance at two separate frequencies simultaneously. By setting the load impedance of a Gallium Nitride High Electron Mobility Transistors (GaN HEMTs) device load impedance at the two-tone frequency separately, the relationship between nonlinear performance and associated device load impedance variations was investigated. This approach yields a better understanding of the RF device's nonlinear behavior, particularly within the context of modern wireless communication systems.