Details

Autor(en) / Beteiligte

• Kronenberg, J.
• Xiong, Y.
• Pieper, N.
• Ball, D.
• Bhuva, B.

Titel

Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages

Ist Teil von

• 2024 IEEE International Reliability Physics Symposium (IRPS), 2024, p.1-5

Ort / Verlag

IEEE

Erscheinungsjahr

2024

Quelle

IEEE/IET Electronic Library (IEL)

Beschreibungen/Notizen

• Single-event (SE) cross-section trends are investigated at near-threshold-voltage (NTV) supply voltages for conventional D-flip-flop (D-FF) designs with different V T options and RHBD flip-flop (FF) designs at the 5-nm FinFET node. Results show very different responses for each design, yielding a wide range of choices for meeting design specifications.