Details

Autor(en) / Beteiligte

• Basolo, S.
• Bérar, Jean-François
• Boudet, Nathalie
• Breugnon, P.
• Chantepie, B.
• Clémens, J.C.
• Delpierre, P.
• Dinkespiler, B.
• Hustache, S.
• Medjoubi, K.
• Ménouni, M.
• Morel, C.
• Pangaud, P.
• Vigeolas, E.

Titel

A 20 kpixels CdTe photon-counting imager using XPAD chip

Ist Teil von

• Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2008-05, Vol.589, p.268-274

Ort / Verlag

Elsevier

Erscheinungsjahr

2008

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• A 20 kpixels CdTe sensor has been hybridized on XPAD3S CMOS photon counting chips, forming a 19200 pixels imaging device. P-type CdTe with rectifying contact has been employed. This sensor works in hole collection mode with a pulse shaping time of about 150 ns. Detector construction and operation are described and first results obtained with 241Am source as well as diffraction images using an X-ray synchrotron beam are presented. Polarisation effects are present but remain at a very manageable level. Keywords: pixel detector, photon counting, CdTe, hole collection, XPAD3