Details

Autor(en) / Beteiligte

• Adachi, I.
• Adamczyk, K.
• Aggarwal, L.
• Ahmed, H.
• Aihara, H.
• Akopov, N.
• Aloisio, A.
• Anh Ky, N.
• Asner, D. M.
• Atmacan, H.
• Aushev, T.
• Aushev, V.
• Aversano, M.
• Babu, V.
• Bae, H.
• Bahinipati, S.
• Bambade, P.
• Banerjee, Sw
• Barrett, M.
• Baudot, J.
• Bauer, M.
• Baur, A.
• Beaubien, A.
• Becker, J.
• Behera, P. K.
• Bennett, J. V.
• Bertacchi, V.
• Bertemes, M.
• Bertholet, E.
• Bessner, M.
• Bettarini, S.
• Bhuyan, B.
• Bianchi, F.
• Bilka, T.
• Biswas, D.
• Bodrov, D.
• Bondar, A.
• Borah, J.
• Bozek, A.
• Bračko, M.
• Branchini, P.
• Briere, R. A.
• Browder, T. E.
• Budano, A.
• Bussino, S.
• Campajola, M.
• Cao, L.
• Casarosa, G.
• Cecchi, C.
• Cerasoli, J.
• Chang, P.
• Cheaib, R.
• Cheema, P.
• Chekelian, V.
• Chen, C.
• Cheon, B. G.
• Chilikin, K.
• Chirapatpimol, K.
• Cho, H. -E.
• Cho, K.
• Cho, S. -J.
• Choi, S. -K.
• Choudhury, S.
• Cochran, J.
• Corona, L.
• Cremaldi, L. M.
• Das, S.
• Dattola, F.
• De La Cruz-Burelo, E.
• de la Motte, S. A.
• de Marino, G.
• de Nuccio, M.
• de Pietro, G.
• de Sangro, R.
• Destefanis, M.
• de Yta-Hernandez, A.
• Dhamija, R.
• Di Canto, A.
• Di Capua, F.
• Dingfelder, J.
• Doležal, Z.
• Domínguez Jiménez, I.
• Dong, T. V.
• Dorigo, M.
• Dort, K.
• Dreyer, S.
• Dubey, S.
• Dujany, G.
• Ecker, P.
• Eliachevitch, M.
• Feichtinger, P.
• Ferber, T.
• Ferlewicz, D.
• Fillinger, T.
• Finck, C.
• Finocchiaro, G.
• Fodor, A.
• Forti, F.
• Fulsom, B. G.
• Gabrielli, A.

Titel

Measurement of CP Violation in B0 → KS0π0 Decays at Belle II

Ist Teil von

• Physical review letters, 2023-09, Vol.131 (11)

Ort / Verlag

United States: American Physical Society

Erscheinungsjahr

2023

Quelle

American Physical Society Journals

Beschreibungen/Notizen

• We report a measurement of the $C\!P$-violating parameters $A$ and $S$ in $B^{0}\to K_{S}^{0} \pi^{0}$ decays at Belle II using a sample of $387\times 10^{6}$ $B\bar{B}$ events recorded in $e^{+}e^{-}$ collisions at a center-of-mass energy corresponding to the $\Upsilon(4S)$ resonance. These parameters are determined by fitting the proper decay-time distribution of a sample of 415 signal events. We obtain $A = 0.04^{+0.15}_{-0.14}\pm 0.05$ and $S = 0.75^{+0.20}_{-0.23}\pm 0.04$, where the first uncertainties are statistical and the second are systematic.