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A SIMS and TEM investigation of the microstructure of wear-resistant ductile cast iron
Surface and interface analysis, 2013-01, Vol.45 (1), p.441-444
Valle, N.
Martinez Celis, M.
Lacaze, J.
Thorbjornsson, I. O.
Johannesson, B.
Thorgrimsson, J. T.
2013
Volltextzugriff (PDF)
Details
Autor(en) / Beteiligte
Valle, N.
Martinez Celis, M.
Lacaze, J.
Thorbjornsson, I. O.
Johannesson, B.
Thorgrimsson, J. T.
Titel
A SIMS and TEM investigation of the microstructure of wear-resistant ductile cast iron
Ist Teil von
Surface and interface analysis, 2013-01, Vol.45 (1), p.441-444
Ort / Verlag
Chichester: Blackwell Publishing Ltd
Erscheinungsjahr
2013
Quelle
Wiley-Blackwell Journals
Beschreibungen/Notizen
The benefit of the presence of Cr containing inserts inside ductile iron on the tribological properties of these materials has been recently demonstrated. In order to understand these improved properties, a secondary ion mass spectrometry (SIMS) and transmission electron microscopy investigation of these wear‐resistant ductile cast irons has been performed. The results indicate that the principal change in the microstructure induced by inserts occurs in the inserts and in their surroundings where the formation of carbides with different sizes and compositions is observed: M3C, M7C3 and M23C6 (M stands for Fe and/or Cr). These are not pure binary carbides since among the different elements studied by SIMS, Cr, Fe, Mn and, to a lesser extent, Ni are soluble in these carbides. Copyright © 2012 John Wiley & Sons, Ltd.
Sprache
Englisch
Identifikatoren
ISSN: 0142-2421
eISSN: 1096-9918
DOI: 10.1002/sia.5119
Titel-ID: cdi_hal_primary_oai_HAL_hal_03468623v1
Format
–
Schlagworte
Atomic, molecular, and ion beam impact and interactions with surfaces
,
chromium carbides
,
Condensed matter: electronic structure, electrical, magnetic, and optical properties
,
ductile cast iron
,
Electron and ion emission by liquids and solids
,
impact phenomena
,
Engineering Sciences
,
Exact sciences and technology
,
Impact phenomena (including electron spectra and sputtering)
,
Materials and structures in mechanics
,
Mechanics
,
Micro and nanotechnologies
,
Microelectronics
,
microstructure
,
nano-analysis SIMS
,
Physics
,
TEM
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