Details

Autor(en) / Beteiligte

• Yan, Zilin
• Guillon, Olivier
• Martin, Christophe L.
• Wang, Steve
• Lee, Chul-Seung
• Bouvard, Didier

Titel

In-situ synchrotron x-ray transmission microscopy of the sintering of multilayers

Ist Teil von

• Applied physics letters, 2013-06, Vol.102 (22)

Ort / Verlag

American Institute of Physics

Erscheinungsjahr

2013

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• This letter reports on in-situ characterization of the high temperature sintering of multilayer ceramic capacitors by high-resolution synchrotron x-ray imaging. Microstructural evolution was obtained in real time by a continuous recording of 2-dimensional radiographs. Anisotropic strains were measured for different layers. Quantification of defects was conducted with 3-dimensional nano-computed tomography. These in-situ observations prove that electrode discontinuities occur at the early stage of sintering and originate from initial heterogeneities linked to the particulate nature of the starting powders.