Details

Autor(en) / Beteiligte

• Wang, W.
• Shao, C.J.
• Yu, D.Y.
• Cai, X.H.

Titel

A wide-band, high-resolution semi-von Hamos spectrometer for K-shell multi-ionization atoms X-ray measurements

Ist Teil von

• Spectrochimica acta. Part B: Atomic spectroscopy, 2024-05, Vol.215, p.106918, Article 106918

Ort / Verlag

Elsevier B.V

Erscheinungsjahr

2024

Quelle

Elsevier ScienceDirect Journals

Beschreibungen/Notizen

• A wide-band, high-resolution vacuum semi-von Hamos spectrometer has been developed for analyzing the X-rays spectra of K-shell multi-ionization atoms. The spectrometer covers an energy dynamic range of 0.6 to 18 keV with a corresponding single exposure spectral bandwidth of 0.25–1.2 keV. This capability is achieved by the combination of different cylindrically bent crystals and an X-ray CCD detector mounted on a twistable bellows, allowing modulation of the Bragg angles from 27° to 47°. A detailed mathematical description is employed to understand the dependence of the geometrical parameters of the spectrometer on the imaging properties, energy spectrum bandwidth, resolving power, solid angle, and other relevant spectrometer characteristics. An energy calibration has been performed by using K X-rays generated by 10–30 keV electron beam interactions with solid KCl, CaF2 and Se targets. The spectrometer exhibits a resolving power better than 103, enabling the analysis of fine spectral structure of K X-ray transitions and the comparison of X-ray properties between pure elements and their compounds due to chemical effects. The spectrometer also finds applications in various fields requiring precise X-ray measurements, including synchrotron radiation experiments, tokamaks, laser plasma diagnostics and laboratory astrophysics. [Display omitted] •A semi-von Hamos X-ray spectrometer with a resolving power of over 1000 is addressed.•A detailed mathematical description of the spectrometer characteristics is implemented.•The spectrometer covers a dynamic range of 0.6–18 keV and has a single exposure spectral bandwidth of 0.25–1.2 keV.•The spectrometer is suitable for many applications requiring high precision X-ray measurements.