IUCrJ, 2016-05, Vol.3 (Pt 3), p.161-162
2016
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- De novo phasing with optimized XFEL data
- Ist Teil von
- IUCrJ, 2016-05, Vol.3 (Pt 3), p.161-162
- Ort / Verlag
- England: International Union of Crystallography
- Erscheinungsjahr
- 2016
- Quelle
- EZB Electronic Journals Library
- Beschreibungen/Notizen
- Nass et al. [IUCrJ (2016), 3, 180-191] have demonstrated that serial femtosecond crystallography (SFX) data collected at X-ray free-electron lasers (XFELs) can be successfully phased using only the weak anomalous scattering from the native S atoms.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 2052-2525eISSN: 2052-2525DOI: 10.1107/S2052252516006758Titel-ID: cdi_doaj_primary_oai_doaj_org_article_e0eb9fa110c64c16a2e5b44c5be5ff1c
- Format
- –
- Schlagworte
- SAD phasing, Scientific Commentaries, serial crystallography, X-ray lasers, XFEL