Details

Autor(en) / Beteiligte

• van Rijn, Peter W.
• Sinharay, Sandip
• Haberman, Shelby J.
• Johnson, Matthew S.

Titel

Assessment of fit of item response theory models used in large-scale educational survey assessments

Ist Teil von

• Large-scale assessments in education, 2016-12, Vol.4 (1), p.1-23, Article 10

Ort / Verlag

New York: Springer US

Erscheinungsjahr

2016

Quelle

Electronic Journals Library

Beschreibungen/Notizen

• Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment of fit of item response theory models in the context of large-scale assessments, there is a scope of further research on the topic. We suggest two types of residuals to assess the fit of item response theory models in the context of large-scale assessments. The Type I error rates and power of the residuals are computed from simulated data. The residuals are computed using data from four NAEP assessments. Misfit was found for all data sets for both types of residuals, but the practical significance of the misfit was minimal.