Details

Autor(en) / Beteiligte

• Santos Jr, Mario. A.
• Voyer, Damien
• Perrussel, Ronan
• Weinzierl, Djonny
• Sartori, Carlos. A. F.
• Krähenbühl, Laurent
• Vollaire, Christian
• Cardoso, José R.

Titel

A load effect evaluation of a transmission line exciting chamber

Ist Teil von

• Journal of Microwaves, Optoelectronics and Electromagnetic Applications, 2011-06, Vol.10 (1), p.42-54

Ort / Verlag

Brazilian Microwave and Optoelectronics Society

Erscheinungsjahr

2011

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• This paper presents an evaluation of the phase shifting excitation and load effects in a Transmission Line Exciting Chamber. This chamber is suggested as an alternative for immunity tests because of the restrictions related to canonical chambers. Here, two methods are used to calculate the E-field: a semi-analytic approach and a numerical one. The semi-analytic method is based on the modal expansion while a software is used for numerical simulations. The results regarding the E-field profile and the related statistical indexes of merit are presented and used to evaluate the chamber performances. Experiments were also conducted in order to evaluate the chamber.