Czech Journal of Food Sciences, 2003-02, Vol.21 (1), p.34-40
2003
Details
- Autor(en) / Beteiligte
- Titel
- Properties of thin metallic films for microwave susceptors
- Ist Teil von
- Czech Journal of Food Sciences, 2003-02, Vol.21 (1), p.34-40
- Ort / Verlag
- Prague: Czech Academy of Agricultural Sciences (CAAS)
- Erscheinungsjahr
- 2003
- Link zum Volltext
- Quelle
- EZB Electronic Journals Library
- Beschreibungen/Notizen
- Thin Al films of varying thickness, i.e. 3 to 30 nm, were deposited onto polyethylene-terephthalate film by evaporation in the vacuum of 0.003 Pa. The dependence of DC (direct current) surface resistance on thickness was measured using a four-point method. The surface resistance exhibits the size effect in accordance with the Fuchs-Sondheimer theory. The microwave absorption properties of the prepared films of various metallization thickness were measured in a microwave field at the microwave power of 1.8 mW. The maximum microwave absorption at 2.45 GHz was found to occur in a layer of optical density of about 0.22.
- Sprache
- Englisch; Tschechisch; Slowakisch
- Identifikatoren
- ISSN: 1212-1800eISSN: 1805-9317DOI: 10.17221/3475-CJFSTitel-ID: cdi_doaj_primary_oai_doaj_org_article_95e45158cc3d4c1aa99a662dde67bab4
- Format
- –
- Schlagworte
- ABSORCION, ABSORPTION, ALUMINIO, ALUMINIUM, Aluminum, dc surface resistance, Direct current, ELECTRICAL PROPERTIES, EPAISSEUR, ESPECTROMETRIA, ESPESOR, Evaporation, FILM PLASTIQUE, food packaging, MATERIALES DE EMPAQUE, MATERIAU DE CONDITIONNEMENT, Metal films, Metallizing, Microwave absorption, microwave susceptors, MICROWAVE TREATMENT, Optical density, OPTICAL PROPERTIES, PACKAGING MATERIALS, PELICULA PLASTICA, PLASTIC FILM, POLIETILENO, POLYETHYLENE, Polyethylene terephthalate, PROPIEDADES ELECTRICAS, PROPIEDADES OPTICAS, PROPRIETE ELECTRIQUE, PROPRIETE OPTIQUE, Size effects, SPECTROMETRIE, SPECTROMETRY, Surface chemistry, Surface resistance, THICKNESS, Thickness measurement, Thin films, TRAITEMENT AUX MICROONDES, TRATAMIENTO POR MICROONDAS