Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...
Ergebnis 14 von 49

Details

Autor(en) / Beteiligte
Titel
Eliminating surface cracks in metal film-polymer substrate for reliable flexible piezoelectric devices
Ist Teil von
  • Engineering science and technology, an international journal, 2024-02, Vol.50, p.101617, Article 101617
Ort / Verlag
Elsevier B.V
Erscheinungsjahr
2024
Link zum Volltext
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
  • [Display omitted] In a flexible piezoelectric-metal-polymer device, the occurrence of surface cracks in metal-polymer interface may cause unstable metal connections, unreliable piezoelectric yield, poor passivation behaviour and metal electrode delamination. In this study, the properties of polydimethylsiloxane (PDMS) polymer substrate are optimised, and the sputter-deposition of aluminium (Al) and molybdenum (Mo) metal film layer is controlled to eradicate cracks and promote only surface wrinkles on large area metal-polymer interface. The PDMS substrate thickness of ∼123.8 µm, 20:1 prepolymer base to curing agent weight ratio, 50 °C PDMS curing temperature and 30 min of Al sputtering time have been discovered to produce crack-free wrinkle-only Al thin film layer on PDMS substrate. The Al thin film is 100 % conductive over large area and adhere well on PDMS with 0 % of Al removal. The grown zinc oxide (ZnO) and aluminium nitride (AlN) piezoelectric layer on the improved Al-PDMS are of good crystal quality, generating low leakage current and decent piezoelectric voltage. The attained crack-free wrinkled-only metal film-polymer substrate interface is vital for flexible piezoelectric-metal-polymer device to perform well as an acoustic sensor, energy harvester, or even as an insulation/buffer layer in stretchable electronics.
Sprache
Englisch
Identifikatoren
ISSN: 2215-0986
eISSN: 2215-0986
DOI: 10.1016/j.jestch.2024.101617
Titel-ID: cdi_doaj_primary_oai_doaj_org_article_6f1d67732f394640a71f590943efc1fd

Weiterführende Literatur

Empfehlungen zum selben Thema automatisch vorgeschlagen von bX