Details

Autor(en) / Beteiligte

• Chayanun, Lert
• Hammarberg, Susanna
• Dierks, Hanna
• Otnes, Gaute
• Björling, Alexander
• Borgström, Magnus T
• Wallentin, Jesper

Titel

Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline

Ist Teil von

• Crystals (Basel), 2019-08, Vol.9 (8), p.432

Ort / Verlag

Basel: MDPI AG

Erscheinungsjahr

2019

Quelle

EZB Electronic Journals Library

Beschreibungen/Notizen

• The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices.