Details

Autor(en) / Beteiligte

• Kim, Subin
• Bae, Sung Hwa
• Son, Injoon

Titel

Effect of the ENEPIG Process on the Bonding Strength of BiTe-based Thermoelectric Elements

Ist Teil von

• Archives of metallurgy and materials, 2021-01, Vol.66 (4), p.967-970

Ort / Verlag

Warsaw: Polish Academy of Sciences

Erscheinungsjahr

2021

Link zum Volltext

Quelle

Elektronische Zeitschriftenbibliothek (Open access)

Beschreibungen/Notizen

• To improve the mechanical performance of BiTe-based thermoelectric modules, this study applies anti-diffusion layers that inhibit the generation of metal intercompounds and an electroless nickel/electrode palladium/mission gold (ENEPIG) plating layers to ensure a stable bonding interface. If a plated layer is formed only on BiTe-based thermoelectric, the diffusion of Cu in electrode substrates produces an intermetallic compound. Therefore, the ENEPIG process was applied on the Cu electrode substrate. The bonding strength highly increased from approximately 10.4 to 16.4 MPa when ENEPIG plating was conducted to the BiTe-based thermoelectric element. When ENEPIG plating was performed to both the BiTe-based thermoelectric element and the Cu electrode substrate, the bonding strength showed the highest value of approximately 17.6 MPa, suggesting that the ENEPIG process is effective in ensuring a highly reliable bonding interface of the BiTe-based thermoelectric module.