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Deep Levels in Undoped and ErCl 3 -Doped TlGaS 2 Single Crystals
Ist Teil von
Japanese Journal of Applied Physics, 1993-12, Vol.32 (S3), p.610
Erscheinungsjahr
1993
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
TlGaS
2
and TlGaS
2
:ErCl
3
single crystals were grown by the Bridgman technique. The optical energy band gaps and the deep levels of the as-grown crystals were investigated by the optical absorption, thermally stimulated current (TSC), and, photo-induced current transient spectroscopy (PICTS) spectra. The electron traps (0.18±0.01 eV and 0.23±0.01 eV) and the hole traps (0.36±0.02 eV and 0.66±0.02 eV) are observed in TlGaS
2
single crystal. In the case of TlGaS
2
:ErCl
3
single crystal, two deep levels as donors are located at 0.15±0.01 eV and 0.25±0.01 eV and, one deep level as acceptor, at 0.64±0.02 eV.