Details

Autor(en) / Beteiligte

• Wang, L.M.
• Wu, A.Y.
• Ewing, R.C.

Titel

Amorphization of PLZT Material by 1.5 MeV Krypton Ion Irradiation with In Situ TEM Observation

Ist Teil von

• MRS proceedings, 1992, Vol.268, Article 343

Ort / Verlag

New York, USA: Cambridge University Press

Erscheinungsjahr

1992

Beschreibungen/Notizen

• PLZT 9/65/35 single crystals were irradiated with 1.5 MeV krypton ions at 25–450°C in the HVEM-Tandem Facility at Argonne National Laboratory. In-situ TEM was performed during irradiation in order to determine the critical amorphization dose. At room temperature, the material was completely amorphized after a dose of only 1.9×1014 ions/cm2, less than one fifth of the critical amorphization dose for silicon (1×1015 ions/cm2). The critical amorphization dose for the PLZT material increased with increasing irradiation temperature. At 450°C, amorphization was not observed after a dose of 1.1×10 15ions/cm2.