Details

Autor(en) / Beteiligte

• Crampin, S.
• Vvedensky, D.D.
• Maclaren, J.M.
• Eberhart, M.E.

Titel

Electronic Structure of Extended Defects in Close-Packed Metals

Ist Teil von

• MRS proceedings, 1988, Vol.141, Article 373

Ort / Verlag

New York, USA: Cambridge University Press

Erscheinungsjahr

1988

Beschreibungen/Notizen

• Stacking faults in close-packed metals are known to play a crucial role in determining mechanical behaviour. Extending recent layer Korringa-Kohn-Rostoker calculations on twin faults in a variety of FCC crystals, we study in detail the aluminium defect and develop an atomistic understanding of the modifying behaviour of small concentrations of impurity atoms.