Details

Autor(en) / Beteiligte

• Heigl, Nico
• Petter, Christine H.
• Najam-Ul-Haq, Mohammad
• Rainer, Matthias
• Vallant, Rainer M.
• Bonn, Günther K.
• Huck, Christian W.

Titel

When Size Matters—Near Infrared Reflection Spectroscopy of Nanostructured Materials

Ist Teil von

• Journal of near infrared spectroscopy (United Kingdom), 2008-06, Vol.16 (3), p.211-221

Ort / Verlag

London, England: SAGE Publications

Erscheinungsjahr

2008

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• This article evaluates the applicability of near infrared (NIR) reflection spectroscopy for the physico-chemical and morphological characterisation of matter on a scale smaller than 1 micrometre (normally between 1 and 100 nanometres). The investigated materials comprise porous and non-porous silica particles, carbon based materials such as C60 fullerenes, nano-crystalline diamond (NCD) and dendrimers, all of them having diameters and/or pore sizes in the nanometre range, respectively. In case of the silica packings and differently derivatised C60 fullerenes, absorbance signals could be clearly assigned to corresponding surface modifications. Identification or classification of the material can be achieved successfully by principal component analysis. Nano crystalline diamond surfaces, whether H- or O-terminated, could be differentiated by a computed partial least squares (PLS) regression model with around 80% precision. Generations 0–7 of poly(amidoamine) (PAMAM) dendrimers with functionalised surface amine groups are characterised in respect of particle diameter and molecular weight. The established PLS models showed a standard error of prediction of only 0.43 nm and 12.30 kDa, respectively. NIR spectroscopy has developed as a flexible analytical method that can be utilized for fast, reliable and highly reproducible screening of matter even in the nanometer range.