Details

Autor(en) / Beteiligte

• Barsukov, V. P.
• Verhoglad, A. G.
• Gerasimov, V. V.
• Glebus, I. S.
• Zavyalova, M. A.
• Knyazev, B. A.
• Makarov, S. N.
• Stupak, M. F.
• Ovchar, V. K.
• Rodionov, D. G.
• Choporova, Yu. Yu
• Shtatnov, V. Yu

Titel

A terahertz scanning near-field optical microscope with an attenuated total internal reflection module

Ist Teil von

• Instruments and experimental techniques (New York), 2014-09, Vol.57 (5), p.579-586

Ort / Verlag

Moscow: Pleiades Publishing

Erscheinungsjahr

2014

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• The first terahertz scanning near-field optical microscope with an attenuated total internal reflection module and a free-electron laser (FEL) as the radiation source was developed. A scanning system with positioning using a confocal sensor with chromatic coding and a surface-subwavelength probe touch sensor were developed and tested. A new technique for sensing the distance between the probe and a conducting surface via corona-discharge current measurement was developed. A specific lock-in system for detection of probe-scattered pulse-periodic radiation, which includes a hot-electron superconducting bolometer and an electronic signal-storage circuit, was developed to operate with the Novosibirsk terahertz FEL. All elements of the microscope were tested, and their working capacity was demonstrated. Experiments on the detection of microscope-probe-scattered terahertz radiation have been initiated.