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We use a single event latchup (SEL) model calibrated to heavy ion (HI) and proton data below 230 MeV to extrapolate the proton cross section to larger energies and evaluate the impact of the potential cross section increase with energy on the SEL rate in different environments. We show that in the case of devices with a large LET onset for HI and a certain amount of tungsten near the sensitive volume (SV), the calculated failure rates for energetic environments based on monoenergetic test data can significantly underestimate the real value. In addition, we show through measurements using a 480 MeV beam and an inspection of the device's architecture that the model was successful in estimating the SEL cross section and tungsten volume per cell.