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Details

Autor(en) / Beteiligte
Titel
Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier
Ist Teil von
  • IEEE transactions on microwave theory and techniques, 2015-12, Vol.63 (12), p.4072-4082
Ort / Verlag
New York: IEEE
Erscheinungsjahr
2015
Link zum Volltext
Quelle
IEEE Electronic Library (IEL)
Beschreibungen/Notizen
  • This paper describes analysis of the far-out spurious noise and a method to reduce this noise in an envelope-tracking power amplifier (ET PA). The ET PA delivers a higher efficiency and a better linearity than the stand-alone PA, simultaneously. However, the ET PA generates spectral regrowth at a far-out spurious emission domain. The noise sources are analyzed, and the noise effects on a RF PA are estimated using mathematical models of the RF PA and supply modulator. To reduce the noise, a wideband supply modulator is designed using 40-nm CMOS process for a high speed operation, and an additional capacitor is connected to the supply line of the PA. These noise reduction techniques significantly reduce the far-out spurious noise of the ET PA to a level similar to that of the stand-alone PA. For a 10-MHz bandwidth and 6.5-dB peak-to-average power ratio long term evolution signal, the ET PA delivers a power-added efficiency of 41.8%, a gain of 23.8 dB, and an evolved universal terrestrial radio access adjacent channel leakage ratio of -34.3 dBc at an average output power of 27 dBm and an operating frequency of 1.85 GHz. The noise power spectrum densities of the ET PA are -130.3/-133.7 dBm/Hz at 1.93/1.99 GHz, respectively, which is limited by our PA itself.
Sprache
Englisch
Identifikatoren
ISSN: 0018-9480
eISSN: 1557-9670
DOI: 10.1109/TMTT.2015.2495178
Titel-ID: cdi_crossref_primary_10_1109_TMTT_2015_2495178

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