Details

Autor(en) / Beteiligte

• Li, Eric S.
• Jui-Ching Cheng
• Yu-Cheng Lin

Titel

Measurement Technique for Symmetrical Reciprocal Three-Port Devices Using Two-Port Vector Network Analyzer

Ist Teil von

• IEEE transactions on instrumentation and measurement, 2013-10, Vol.62 (10), p.2773-2783

Ort / Verlag

IEEE

Erscheinungsjahr

2013

Quelle

IEEE Xplore

Beschreibungen/Notizen

• A measurement technique is proposed to conduct S-parameter measurements on symmetrical reciprocal three-port devices using a two-port vector network analyzer. The technique takes the effects of reflection from an unmeasured port terminated with a non-ideal 50-Ω load into consideration. These reflected signals cause errors in S-parameter measurements, especially at higher frequencies where the reflection is too large to be ignored. The errors have been overlooked in the traditional three-port measurement using two-port network analyzers. In this paper, analytic equations are presented for some common symmetrical reciprocal three-port devices to improve the accuracy of their S-parameter measurements. The improvement is justified by comparing the data before/after applying the proposed technique with the measured data from four-port vector network analyzers. In addition, error analysis is conducted to ensure that the errors introduced by vector network analyzers would not be deteriorated by the proposed equations.