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Details

Autor(en) / Beteiligte
Titel
Fabrication of Side-Polished Single Mode-Multimode-Single Mode Fiber and Its Characteristics of Refractive Index Sensing
Ist Teil von
  • IEEE journal of selected topics in quantum electronics, 2017-03, Vol.23 (2), p.238-245
Ort / Verlag
New York: IEEE
Erscheinungsjahr
2017
Link zum Volltext
Quelle
IEEE Xplore
Beschreibungen/Notizen
  • This paper presents a low-cost, flexible, and highly efficient wheel polishing techniques for the fabrication of sidepolished single mode-multimode-single mode fiber (SP-SMSF). The evolution of transmission spectrum of SP-SMSF is measured, simulated, and discussed. The good linear relationship between polished depth (PD) and polish-induced loss has relatively high linear correlation at 95%, allowing us to monitor and control the critical parameter PD in line and in real time. Several desirable SPSMSF with PD = 9.6 , 15, 20.6 μm were fabricated successfully. Their characteristics of refractive index (RI) sensing are investigated experimentally. The results show that SP-SMS sensitivity increases as RI increases, approaching its maximum when the latter gets close to its core. The maximum sensitivity of the SP-SMSF with PD = 20.6 μm is 1190 nm/RIU, comparable to that of chemically etched SMSF. The dependence of the sensitivity on the PD of SP-SMSF is also measured and discussed, showing that an increase in PD can improve the sensitivity of SP-SMSF. In addition, such novel structure of SP-SMSF will provide a flat platform to implement various fiber devices.
Sprache
Englisch
Identifikatoren
ISSN: 1077-260X
eISSN: 1558-4542
DOI: 10.1109/JSTQE.2016.2615941
Titel-ID: cdi_crossref_primary_10_1109_JSTQE_2016_2615941

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