Details

Autor(en) / Beteiligte

• Rud, N. D.
• Ustinov, A. I.

Titel

X-ray Scattering on Stacking Faults in 123 Crystals Considering Local Changes of Distances between Atomic Layers

Ist Teil von

• Journal of applied crystallography, 1996-04, Vol.29 (2), p.159-163

Ort / Verlag

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

Erscheinungsjahr

1996

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• Spatial distribution of X‐ray diffusion scattering intensity conditioned by additional CuO atomic layers [stacking faults (SF)] in the AB2Cu3O7 −x (123) structure has been studied within a cinematic approach. Natural laws of difffraction‐pattern changes caused by increase of SF density and by local changes of interplanar distances of atomic layers in the vicinity of SFs were obtained. The X‐ray method for determination of the SF density and local changes of interplanar distances is described.