Superconductor science & technology, 2010-09, Vol.23 (9), p.095007-095007
2010
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer
- Ist Teil von
- Superconductor science & technology, 2010-09, Vol.23 (9), p.095007-095007
- Ort / Verlag
- Bristol: IOP Publishing
- Erscheinungsjahr
- 2010
- Quelle
- Alma/SFX Local Collection
- Beschreibungen/Notizen
- We present the latest generation of superconductor--insulator--ferromagnet--superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses d1 and d2 in both halves were varied to obtain different combinations of positive and negative critical current densities jc, 1 and jc, 2. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0953-2048eISSN: 1361-6668DOI: 10.1088/0953-2048/23/9/095007Titel-ID: cdi_crossref_primary_10_1088_0953_2048_23_9_095007
- Format
- –
- Schlagworte
- Condensed matter: electronic structure, electrical, magnetic, and optical properties, Critical current density, Diffraction patterns, Exact sciences and technology, F region, Ferromagnetism, Josephson junctions, Magnetic fields, Magnetization, Mathematical models, Multilayers, superlattices , heterostructures, Physics, Proximity effects, weak links, tunneling phenomena, and josephson effects, adreev effect, sn and sns junctions, Superconducting films and low-dimensional structures, Superconductivity, Tunnel junctions