Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...
Behaviour of Charge Carriers in As-Deposited and Annealed Undoped TCO Films
Ist Teil von
Chinese physics letters, 2011-10, Vol.28 (10), p.107307-1-107307-3
Ort / Verlag
IOP Publishing
Erscheinungsjahr
2011
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
We examine the structures, cut-off points of transmittance spectra and electric properties of undoped ZnO, SnO sub(2)and CdO films by scanning electron microscopy, x-ray diffraction, spectrophotometer and Hall-effect measurements, respectively. The films are deposited by using an rf magnetron sputtering system from powder targets in argon and then annealed in vacuum. The structures and properties of the as-deposited films are compared with those of the annealed one. We try to explain the behaviour of charge carriers based on the semiconductor physics theory.