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Hole confinement and energy subbands in a silicon inversion layer using the effective mass theory
Ist Teil von
Journal of applied physics, 1999-07, Vol.86 (1), p.438-444
Erscheinungsjahr
1999
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
We present a study of the main features of a two-dimensional hole gas confined near a Si–SiO2 heterointerface. Starting from the framework of the effective mass theory, we were able to separate the Luttinger Hamiltonian into two 3×3 matrices using a semiaxial approximation and still retaining the warped shape of the isoenergetic surfaces in the kx−ky plane and the coupling of heavy, light, and split-off holes. This allows us to solve iteratively and simultaneously the Schrödinger and Poisson equations in the case of an inversion layer of holes in a P-channel metal–oxide–semiconductor structure for different applied gate biases. We have obtained the energy subbands and the main characteristics of the inversion layer. The form of the energy subbands suggests that the use of parabolic bands should be seriously questioned, and that even the use of a unique effective mass in each subband is not a realistic assumption. Furthermore, our results show that the character of the subbands becomes mixed as k∥ separates from zero, and that the complete dispersion characteristics must be considered in hole studies.
Sprache
Englisch
Identifikatoren
ISSN: 0021-8979
eISSN: 1089-7550
DOI: 10.1063/1.370749
Titel-ID: cdi_crossref_primary_10_1063_1_370749
Format
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