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Effect of crystallographic anisotropy on the resistance switching phenomenon in perovskites
Ist Teil von
Journal of applied physics, 2012-03, Vol.111 (5), p.056106-056106-3
Ort / Verlag
American Institute of Physics
Erscheinungsjahr
2012
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
Resistance switching effects in metal/perovskite contacts based on epitaxial c-axis oriented YBa
2
Cu
3
O
6+c
(YBCO) thin films with different crystallographic orientation have been studied. Three types of Ag/YBCO junctions with the contact restricted to (i) c-axis direction, (ii) ab-plane direction, and (iii) both were designed and fabricated, and their current-voltage characteristics have been measured. The type (i) junctions exhibited conventional bipolar resistance switching behavior, whereas in other two types the low-resistance state was unsteady and their resistance quickly relaxed to the initial high-resistance state. Physical mechanism based on the oxygen diffusion scenario, explaining such behavior, is discussed.
Sprache
Englisch
Identifikatoren
ISSN: 0021-8979
eISSN: 1089-7550
DOI: 10.1063/1.3691598
Titel-ID: cdi_crossref_primary_10_1063_1_3691598
Format
–
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