Details

Autor(en) / Beteiligte

• Veith, M.
• Eick, T.
• Brodkorb, W.
• Manzel, M.
• Bruchlos, H.
• Köhler, T.
• Schmidt, H.-G.
• Steinbeiss, E.
• Fuchs, H.-J.
• Schlenga, K.
• Hechtfischer, G.
• Müller, P.

Titel

Fabrication and properties of intrinsic Josephson junctions in thin films of Tl-Ba-Ca-Cu-O

Ist Teil von

• Journal of applied physics, 1996-09, Vol.80 (6), p.3396-3400

Erscheinungsjahr

1996

Quelle

AIP Journals Complete

Beschreibungen/Notizen

• We have observed intrinsic Josephson effects for current flow perpendicular to the CuO2 planes in HTSC thin films. Tl-Ba-Ca-Cu-O thin films were deposited on step edges in LaAlO3 substrates. Due to the special preparation process, microbridges across such steps act as stacks of intrinsic Josephson junctions with current flow perpendicular to the CuO2 planes (STEP STACK junctions). Up to 130 individual junctions could be observed exhibiting high IcRN products up to 26 mV per junction. We observed ac-Josephson effects as Shapiro steps and in microwave emission experiments. At low temperatures sharp emission peaks were detected at frequencies of 11.3 and 24.2 GHz. Broad emission peaks from the whole stack were observed at temperatures close to Tc.