Details

Autor(en) / Beteiligte

• Lee, N. J.
• Yoo, J. W.
• Choi, Y. J.
• Kang, C. J.
• Jeon, D. Y.
• Kim, D. C.
• Seo, S.
• Chung, H. J.

Titel

The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy

Ist Teil von

• Applied physics letters, 2009-11, Vol.95 (22), p.222107-222107-3

Ort / Verlag

American Institute of Physics

Erscheinungsjahr

2009

Quelle

美国小型学会期刊集（AIP Scitation平台）

Beschreibungen/Notizen

• We report on the interlayer screening effect of graphene using Kelvin probe force microscopy (KPFM). By using a gate device configuration that enables the supply of electronic carriers in graphene sheets, the vertical screening properties were studied from measuring the surface potential gradient. The results show layer-dependence of graphene sheets, as the number of graphene layers increases, the surface potential decreases exponentially. In addition, we calculate the work function-related information of the graphene layers using KPFM.