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N-In codoped ZnO films were prepared by ultrasonic spray pyrolysis. Hall-effect measurements indicate that the films on silicon exhibit anomalous high
p
-type conductivity, while films on insulating substrates show
n
-type conductivity. Scanning capacitance microscopy was employed to analyze the microconductivity type of ZnO films. The grains of ZnO film on silicon show
n
-type conductivity and no significant
p
-type grains were found. The authors further investigated the microstructure of ZnO film and the band structure of the
Zn
O
∕
Si
interface and propose a model of an interface state induced two-dimensional hole gas as the origin of the anomalous high
p
-type behavior.
Sprache
Englisch
Identifikatoren
ISSN: 0003-6951
eISSN: 1077-3118
DOI: 10.1063/1.2437679
Titel-ID: cdi_crossref_primary_10_1063_1_2437679
Format
–
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