Details

Autor(en) / Beteiligte

• Wang, Cheng
• Araki, T.
• Ade, H.

Titel

Soft x-ray resonant reflectivity of low- Z material thin films

Ist Teil von

• Applied physics letters, 2005-11, Vol.87 (21), p.214109-214109-3

Ort / Verlag

American Institute of Physics

Erscheinungsjahr

2005

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• Soft x-ray resonant reflectivity, a method for low- Z materials that combines aspects of neutron reflectivity and x-ray reflectivity, is presented. Resonant reflectivity provides enhanced and selective sensitivity to specific chemical moieties near the absorption edges of constituent elements and was demonstrated through the characterization of a bilayer polymer thin film. The relative reflectivity of a particular interface could be tuned by adjusting the incident photon energy near the carbon 1s absorption edge. The resulting chemical specificity is analogous to using deuteration as a tracer or marker in neutron reflectivity, but without requiring special sample synthesis or preparation.