Details

Autor(en) / Beteiligte

• Kaihara, Mikio
• Mametsuka, Hiroaki
• Gunji, Naoki
• Gohshi, Yohichi

Titel

New accessory for strongly scattering samples in Fourier‐transform infrared spectroscopy

Ist Teil von

• Review of scientific instruments, 1989-06, Vol.60 (6), p.1015-1017

Ort / Verlag

Woodbury, NY: American Institute of Physics

Erscheinungsjahr

1989

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• The Fourier‐transform infrared (FTIR) spectra of pitches or any other strongly scattering samples have large backgrounds. The existence of a large background reduces the accuracy when analyzing the spectrum. Many researchers have tried to reduce the backgrounds by crushing strongly scattering samples as minutely as possible. However, even though the size distributions were less than 10×10−6 m, the spectral backgrounds of pitches were only slightly reduced. The problem remains unresolved. The large background appears because optical compensation between the sample side and the reference side in the IR spectrometer is insufficient from a spectroscopic point of view. Therefore, new dilution materials were proposed for recovering the true meaning of compensation by scattering both the sample and the reference uniformly in our laboratory. However, our method had a problem, i.e., the IR rays reaching the IR detector were attenuated because of the scattering effect of the new dilution materials. To solve this problem, we fabricated a pair of ellipsoidal mirrors and combined new dilution materials together. The spectra measured by our new instrument possess remarkably fine qualities for strongly scattering samples.