Details

Autor(en) / Beteiligte

• Wang, Jing
• Su, Ben-Xun
• Tang, Dong-Mei
• Yuan, Qing-Han
• Li, Wen-Jun
• Gao, Bing-Yu
• Bao, Zhi-An
• Zhao, Ye

Titel

High-precision copper isotopic analysis using a Nu Sapphire MC-ICP-MS

Ist Teil von

• Journal of analytical atomic spectrometry, 2022-11, Vol.37 (12), p.2589-2598

Ort / Verlag

London: Royal Society of Chemistry

Erscheinungsjahr

2022

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• Here we present an analytical method for Cu isotopic measurement using standard-sample bracketing on a Nu Sapphire multi-collector inductively coupled plasma mass spectrometer. The effects of Cu concentration and HNO 3 molarity mismatch between the standard and the sample, as well as the presence of matrix elements have been evaluated. Intermediate precision of better than ±0.030‰ for δ 65 Cu (2SD) was routinely obtained on NIST SRM 3114 and NWU-Cu-A. Accurate measurements were achieved when C Na /C Cu < 0.5, C Ti /C Cu , C Fe /C Cu and C Co /C Cu < 1, C Ni /C Cu < 3 and C Zn /C Cu < 10. High-precision Cu isotopic data were determined for nineteen geological reference materials, including igneous rocks, sedimentary rocks, metamorphic rocks and chalcopyrite, with an overall range of ∼0.44‰ (0.056 to 0.384), nearly 15 times the current analytical precision. The Cu isotopic data of these reference materials can be used for future interlaboratory comparisons. Cu isotopic measurements using a Nu Sapphire CC-MC-ICP-MS.