Details

Autor(en) / Beteiligte

• Wade, Lawrence A
• Shapiro, Ian R
• Ma, Ziyang
• Quake, Stephen R
• Collier, C. Patrick

Titel

Correlating AFM Probe Morphology to Image Resolution for Single-Wall Carbon Nanotube Tips

Ist Teil von

• Nano letters, 2004-04, Vol.4 (4), p.725-731

Ort / Verlag

Washington, DC: American Chemical Society

Erscheinungsjahr

2004

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• Scanning and transmission electron microscopy were used to image hundreds of single-wall carbon nanotube probes and to correlate probe morphology with AFM image resolution. Several methods for fabricating such probes were evaluated, resulting in a procedure that produces image-quality single-wall nanotube probes at a rate compatible with their routine use. Surprisingly, about one-third of the tips image with resolution better than the nanotube probe diameter and, in exceptional cases, with resolution better than 1 nm. This represents the highest lateral resolution reported to date for a SWNT probe.