Details

Autor(en) / Beteiligte

• Cheng, Hui-Wen
• Chang, Yuan-Chih
• Yuan, Chi-Tsu
• Tang, Song-Nien
• Chang, Chia-Seng
• Tang, Jau
• Chen, Fu-Rong
• Pan, Rong-Long
• Tseng, Fan-Gang

Titel

Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips

Ist Teil von

• Journal of physical chemistry. C, 2013-06, Vol.117 (25), p.13239-13246

Ort / Verlag

Columbus, OH: American Chemical Society

Erscheinungsjahr

2013

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• This paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip.