Spectrochimica acta. Part B: Atomic spectroscopy, 2009-09, Vol.64 (9), p.821-832
2009
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- Total reflection X-ray fluorescence and grazing incidence X-ray spectrometry — Tools for micro- and surface analysis. A review
- Ist Teil von
- Spectrochimica acta. Part B: Atomic spectroscopy, 2009-09, Vol.64 (9), p.821-832
- Ort / Verlag
- Elsevier B.V
- Erscheinungsjahr
- 2009
- Quelle
- Alma/SFX Local Collection
- Beschreibungen/Notizen
- A review of Total Reflection X-ray Spectrometry and related methods covering literature of four decades is presented. History, theory, instrumentation, sample preparation, and applications are summarized and some examples are given. New developments and trends are discussed with respect to emerging nano-technologies in all fields of sciences.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0584-8547eISSN: 1873-3565DOI: 10.1016/j.sab.2009.06.012Titel-ID: cdi_crossref_primary_10_1016_j_sab_2009_06_012
- Format
- –
- Schlagworte
- GIXRF, Grazing incidence X-ray spectrometry, Total reflection X-ray spectrometry, TXRF, X-ray standing waves, XSW