Details

Autor(en) / Beteiligte

• Chen, H.
• Kauffmann, A.
• Seils, S.
• Boll, T.
• Liebscher, C.H.
• Harding, I.
• Kumar, K.S.
• Szabó, D.V.
• Schlabach, S.
• Kauffmann-Weiss, S.
• Müller, F.
• Gorr, B.
• Christ, H.-J.
• Heilmaier, M.

Titel

Crystallographic ordering in a series of Al-containing refractory high entropy alloys Ta–Nb–Mo–Cr–Ti–Al

Ist Teil von

• Acta materialia, 2019-09, Vol.176, p.123-133

Ort / Verlag

Elsevier Ltd

Erscheinungsjahr

2019

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• High entropy alloys based on the Ta–Nb–Mo–Cr–Ti–Al system are expected to possess high creep and oxidation resistance as well as outstanding specific mechanical properties due to presumed high melting points and low densities. However, we recently reported that arc-melted and subsequently homogenized alloys within this system exhibit a lack of ductility up to 600 °C [H. Chen et al. in Metall. Mater. Trans. A 49 (2018) 772–781 and J. Alloys Cmpd. 661 (2016) 206–215]. Thermodynamic calculations suggest the formation of a B2-type ordered phase below the homogenization temperature. In the present article, we provide results of a detailed microstructural characterization of a series of Ta–Nb–Mo–Cr–Ti–Al derivatives and evaluate if B2-type ordering could be the origin for the observed lack of ductility. Backscatter electron (BSE) imaging, energy dispersive X-ray spectroscopy (EDX) and atom probe tomography (APT) were used to verify uniform elemental distribution after homogenization. X-ray diffraction (XRD) patterns indicate both, A2 or B2-type crystal structure, whereas transmission electron microscopy (TEM) diffraction experiments unambiguously confirm B2-type order in the as-homogenized state of all investigated alloys. In MoCrTiAl, planar defects that show antiphase boundary contrast with a {100}-type habit plane were detected by TEM dark field (DF) imaging. They are wetted by a Cr-enriched and Ti-depleted layer as confirmed by scanning transmission electron microscopy (STEM)-EDX line scans as well as APT analyses. The planar defects arise from a disorder-order solid-state phase transformation during cooling, as indicated by differential scanning calorimetry (DSC). [Display omitted]