Details

Autor(en) / Beteiligte

• Liu, X.N.
• Xu, Y.X.
• Han, S.Y.
• Wang, L.C.
• Jin, T.Z.
• Tong, S.
• Bao, X.M.

Titel

Investigations of electron spin resonance on light emitting nano-crystallites embedded in a-Si:H films

Ist Teil von

• Solid state communications, 1994-12, Vol.92 (12), p.951-955

Ort / Verlag

Oxford: Elsevier Ltd

Erscheinungsjahr

1994

Link zum Volltext

Quelle

Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)

Beschreibungen/Notizen

• We report here the studies of electron spin resonance (ESR) on light emitting nano-crystallites embedded in a-Si:H matrix, which are prepared by plasma enhanced CVD on quartz substrates without any post-processing. The ESR spectra contains three components: (1) A pair of hyperfine lines of axial symmetry with g  =1.9967 and g ⊥=2.0016, and thehyperfine constant 120G; (2) an isotropic line with g=2.0052 and line-width ΔH pp=10G; (3) an axial symmetric line with g  =2.0042 and g ⊥=2.0057. The dependence of these paramagnetic defects on sample preparation conditions and light emission intensity are presented.