Applied physics. A, Materials science & processing, 2008-08, Vol.92 (2), p.381-385
2008
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Details
- Autor(en) / Beteiligte
- Titel
- Influence of a Cr seed layer on the magnetic anisotropy of epitaxial Fe/Ag films on MgO(001)
- Ist Teil von
- Applied physics. A, Materials science & processing, 2008-08, Vol.92 (2), p.381-385
- Ort / Verlag
- Berlin/Heidelberg: Springer-Verlag
- Erscheinungsjahr
- 2008
- Quelle
- Alma/SFX Local Collection
- Beschreibungen/Notizen
- The magnetic anisotropy of epitaxial 300 Å thick Fe films on Ag and Ag/Cr buffer layers on MgO(001) has been studied by ferromagnetic resonance and magneto-optic Kerr effect measurements. The samples were grown by molecular beam epitaxy at ambient temperature. A reduction of the effective magnetization for the samples with a Ag buffer layer is attributed to strain and dislocation formation as seen from X-ray diffraction measurements at low and high angles. In the samples with a Cr seed layer, a higher magnetic anisotropy is found which correlates with a reduced roughness.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0947-8396eISSN: 1432-0630DOI: 10.1007/s00339-008-4535-xTitel-ID: cdi_crossref_primary_10_1007_s00339_008_4535_x
- Format
- –
- Schlagworte
- Characterization and Evaluation of Materials, Condensed Matter Physics, Condensed matter: electronic structure, electrical, magnetic, and optical properties, Exact sciences and technology, Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances, spin-wave resonance, Machines, Magnetic properties and materials, Magnetic properties of monolayers and thin films, Magnetic properties of surface, thin films and multilayers, Magnetic resonances and relaxations in condensed matter, mössbauer effect, Magnetooptical effects, Manufacturing, Nanotechnology, Optical and Electronic Materials, Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation, Optical properties of bulk materials and thin films, Physics, Physics and Astronomy, Processes, Surfaces and Interfaces, Thin Films