Details

Autor(en) / Beteiligte

• Kobayashi, Eiichi
• Okudaira, Koji K.
• Okajima, Toshihiro

Titel

Effects of annealing on the molecular orientation in polytetrafluoroethylene thin films

Ist Teil von

• Surface and interface analysis, 2012-06, Vol.44 (6), p.740-743

Ort / Verlag

Chichester, UK: John Wiley & Sons, Ltd

Erscheinungsjahr

2012

Quelle

Wiley-Blackwell Journals

Beschreibungen/Notizen

• The effects of annealing on the molecular orientation in polytetrafluoroethylene (PTFE) thin films evaporated on copper and silicon plates were studied using F K‐edge near‐edge X‐ray absorption fine structure (NEXAFS) spectroscopy. The intensity of the F 1 s → σ*(C‐F) transition in the NEXAFS spectrum from a non‐annealed PTFE thin film on a copper plate at a glancing X‐ray incidence angle was stronger than that at the normal incidence angle. For a thin film annealed at ~250 °C in a nitrogen atmosphere, the σ*(C‐F) peak intensity at the glancing angle was weaker than that at a normal angle. The F K‐edge NEXAFS spectra of a thin film annealed at ~350 °C showed a weakening dependence on the X‐ray incidence angle. This result indicates that the molecules in a PTFE thin film are increasingly oriented normal to the substrate surface with increasing annealing temperature and are oriented randomly. Copyright © 2012 John Wiley & Sons, Ltd.