Details

Autor(en) / Beteiligte

• Wang, Laung-Terng
• Wu, Cheng-Wen
• Wen, Xiaoqing

Titel

VLSI Test Principles and Architectures - Design for Testability

Auflage

1

Ort / Verlag

San Francisco: Elsevier

Erscheinungsjahr

2006

Link zum Volltext

Quelle

ScienceDirect eBooks

Beschreibungen/Notizen

• This book is a comprehensive guide to new design for testability (DFT) methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Key features include up-to-date coverage of design for testability, coverage of industry practices commonly found in commercial DFT tools but not discussed in other books, and numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Practitioners/Researchers in VLSI design and testing; design or test engineers, as well as research institutes will benefit from this book. This book is also appropriate for undergraduate and graduate-level courses in electronic testing, digital systems testing, digital logic test and simulation, and VLSI design.